Record link: 
http://hdl.handle.net/20.500.12708/144519
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Title: 
Intrinsic Charge Trapping in Amorphous Oxide Films: Status and Challenges
en
Citation: 
Strand, J., Moloud, K., Gao, D., El-Sayed, A.-M. B., Afanas´Ev, V., & Shluger, A. L. (2018). Intrinsic Charge Trapping in Amorphous Oxide Films: Status and Challenges. Journal of Physics: Condensed Matter, 30(23), 233001. https://doi.org/10.1088/1361-648x/aac005
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Publisher DOI: 
10.1088/1361-648x/aac005
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Strand, Jack 
Moloud, Kaviani 
Gao, David 
El-Sayed, Al-Moatasem Bellah 
Afanas´Ev, V. 
Shluger, A.L. 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Journal: 
Journal of Physics: Condensed Matter 
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ISSN: 
0953-8984
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Date (published): 
15-May-2018
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Number of Pages: 
21
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Publisher: 
IOP PUBLISHING LTD
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Peer reviewed: 
Yes
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Keywords: 
Condensed Matter Physics; General Materials Science
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Research Areas: 
Structure-Property Relationship: 20%
Non-metallic Materials: 20%
Computational Materials Science: 60%
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
Nanotechnologie
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