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Vaziri, Sam
 

Own Publications Eigene Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Illarionov, Yury Yu. ; Waltl, Michael ; Smith, Anderson D. ; Vaziri, Sam ; Ostling, Mikael ; Lemme, Max C. ; Grasser, Tibor Bias-Temperature Instability on the Back Gate of Single-Layer Double-Gated Graphene Field-Effect TransistorsArtikel Article 2016
2Illarionov, Yury ; Waltl, Michael ; Smith, Anderson ; Vaziri, Sam ; Ostling, Mikael ; Lemme, Max ; Grasser, Tibor Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistorsKonferenzbeitrag Inproceedings2015
3Illarionov, Yury ; Smith, Anderson ; Vaziri, Sam ; Ostling, Mikael ; Mueller, Thomas ; Lemme, Max ; Grasser, Tibor Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and DifferencesArtikel Article2015