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Kim, J.-S.
 

Own Publications Eigene Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Illarionov, Yu. Yu. ; Rzepa, G. ; Waltl, M. ; Knobloch, T. ; Kim, J.-S. ; Akinwande, D. ; Grasser, T. Accurate mapping of oxide traps in highly-stable black phosphorus FETsKonferenzbeitrag Inproceedings 2017
2Illarionov, Yury ; Waltl, Michael ; Jech, Markus ; Kim, J.-S. ; Akinwande, D. ; Grasser, Tibor Reliability of black phosphorus field-effect transistors with respect to bias-temperature and hot-carrier stressKonferenzbeitrag Inproceedings 2017
3Illarionov, Yu. Yu. ; Waltl, M. ; Rzepa, G. ; Knobloch, T. ; Kim, J.-S. ; Akinwande, D. ; Grasser, T. Highly-Stable Black Phosphorus Field-Effect Transistors with Low Density of Oxide TrapsArtikel Article 2017
4Illarionov, Yury ; Waltl, Michael ; Kim, J.-S. ; Akinwande, D. ; Grasser, Tibor Temperature-dependent Hysteresis in Black Phosphorus FETsKonferenzbeitrag Inproceedings2016