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| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Knobloch, Theresia ; Illarionov, Yury Yu. ; Ducry, Fabian ; Schleich, Christian ; Wachter, Stefan ; Watanabe, Kenji ; Taniguchi, Takashi ; Mueller, Thomas ; Waltl, Michael ; Lanza, Mario ; Vexler, Mikhail I. ; Luisier, Mathieu ; Grasser, Tibor | The Performance Limits of Hexagonal Boron Nitride as an Insulator for Scaled CMOS Devices Based on Two-Dimensional Materials | Artikel Article  | 2021 |
| 2 | | Illarionov, Yury Yu. ; Knobloch, Theresia ; Jech, Markus ; Lanza, Mario ; Akinwande, Deji ; Vexler, Mikhail I. ; Mueller, Thomas ; Lemme, Max C. ; Fiori, Gianluca ; Schwierz, Frank ; Grasser, Tibor | Insulators for 2D Nanoelectronics: The Gap to Bridge | Artikel Article | 2020 |
| 3 | | Illarionov, Yury Yu. ; Banshchikov, Alexander G. ; Polyushkin, Dmitry K. ; Wachter, Stefan ; Knobloch, Theresia ; Thesberg, Mischa ; Mennel, Lukas ; Paur, Matthias ; Stöger-Pollach, Michael ; Steiger-Thirsfeld, Andreas ; Vexler, Mikhail I. ; Waltl, Michael ; Sokolov, Nikolai S. ; Mueller, Thomas ; Grasser, Tibor | Ultrathin Calcium Fluoride Insulators for Two-Dimensional Field-Effect Transistors | Artikel Article | 2019 |
| 4 | | Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Makarov, Alexander ; Vexler, Mikhail I. ; Kaczer, Ben ; Grasser, Tibor | Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach | Artikel Article | 2017 |
| 5 | | Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Kaczer, Ben ; Makarov, Alexander ; Vexler, Mikhail I. ; Grasser, Tibor | A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs | Konferenzbeitrag Inproceedings | 2016 |
