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Full name Familienname, Vorname
Vexler, Mikhail I.
 

Own Publications Eigene Publikationen

Results 1-5 of 5 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Knobloch, Theresia ; Illarionov, Yury Yu. ; Ducry, Fabian ; Schleich, Christian ; Wachter, Stefan ; Watanabe, Kenji ; Taniguchi, Takashi ; Mueller, Thomas ; Waltl, Michael ; Lanza, Mario ; Vexler, Mikhail I. ; Luisier, Mathieu ; Grasser, Tibor The Performance Limits of Hexagonal Boron Nitride as an Insulator for Scaled CMOS Devices Based on Two-Dimensional MaterialsArtikel Article 2021
2Illarionov, Yury Yu. ; Knobloch, Theresia ; Jech, Markus ; Lanza, Mario ; Akinwande, Deji ; Vexler, Mikhail I. ; Mueller, Thomas ; Lemme, Max C. ; Fiori, Gianluca ; Schwierz, Frank ; Grasser, Tibor Insulators for 2D Nanoelectronics: The Gap to BridgeArtikel Article 2020
3Illarionov, Yury Yu. ; Banshchikov, Alexander G. ; Polyushkin, Dmitry K. ; Wachter, Stefan ; Knobloch, Theresia ; Thesberg, Mischa ; Mennel, Lukas ; Paur, Matthias ; Stöger-Pollach, Michael ; Steiger-Thirsfeld, Andreas ; Vexler, Mikhail I. ; Waltl, Michael ; Sokolov, Nikolai S. ; Mueller, Thomas ; Grasser, Tibor Ultrathin Calcium Fluoride Insulators for Two-Dimensional Field-Effect TransistorsArtikel Article 2019
4Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Makarov, Alexander ; Vexler, Mikhail I. ; Kaczer, Ben ; Grasser, Tibor Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion ApproachArtikel Article 2017
5Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Kaczer, Ben ; Makarov, Alexander ; Vexler, Mikhail I. ; Grasser, Tibor A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETsKonferenzbeitrag Inproceedings 2016