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Nagel, N.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Bittner, Achim ; Nagel, N. ; Seidel, Helmut ; Schmid, Ulrich	The Impact of Substrate Properties on the Electromigration Resistance of Sputter-Deposited Cu Thin Films	Präsentation Presentation	2011
	2		Bittner, Achim ; Nagel, N. ; Seidel, Helmut ; Schmid, Ulrich	The Impact of Substrate Properties on the Electromigration Resistance of Sputter-Deposited Cu Thin Films	Konferenzbeitrag Inproceedings	2011