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Pepponi, G.
 

Own Publications Eigene Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Perneczky, L. ; Rauwolf, M. ; Ingerle, D. ; Eichert, D. ; Brigidi, F. ; Jark, W. ; Bjeoumikhova, S. ; Pepponi, G. ; Wobrauschek, P. ; Streli, C. ; Turyanskaya, A. Temporary implementation and testing of a confocal SR-μXRF system forbone analysis at the X-ray Fluorescence beamline at ElettraArtikel Article 9-May-2018
2Ingerle, D. ; Pepponi, G. ; Meirer, F. ; Wobrauschek, P. ; Streli, C. JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsArtikel Article 2016
3Ingerle, D. ; Meirer, F. ; Pepponi, G. ; Demenev, E. ; Giubertoni, D. ; Wobrauschek, P. ; Streli, C. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributionsArtikel Article2014
4Meirer, F. ; Demenev, E. ; Giubertoni, D. ; Gennaro, S. ; Vanzetti, L. ; Pepponi, G. ; Bersani, M. ; Sahiner, M. A. ; Steinhauser, G. ; Foad, M. A. ; Woicik, J. C. ; Mehta, A. ; Pianetta, P. Formation Of Arsenic Rich Silicon Oxide Under Plasma Immersion Ion Implantation And Laser AnnealingArtikel Article2012
5Ingerle, D. ; Meirer, F. ; Zoeger, N. ; Pepponi, G. ; Giubertoni, D. ; Steinhauser, G. ; Wobrauschek, P. ; Streli, C. A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layersArtikel Article2010
6Meirer, F. ; Pepponi, G. ; Streli, C. ; Wobrauschek, P. ; Zoeger, N. Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic tracesArtikel Article2009
7Horntrich, C. ; Meirer, F. ; Streli, C. ; Kregsamer, P. ; Pepponi, G. ; Zoeger, N. ; Wobrauschek, P. Influence of the sample morphology on total reflection X-ray fluorescence analysisArtikel Article2009
8Meirer, F. ; Pepponi, G. ; Streli, C. ; Wobrauschek, P. ; Kregsamer, P. ; Zoeger, N. ; Falkenberg, G. Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenicArtikel Article Dec-2008
9Meirer, F. ; Streli, C. ; Pepponi, G. ; Wobrauschek, P. ; Zaitz, M. A. ; Horntrich, C. ; Falkenberg, G. Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surfaceArtikel Article2008
10Zoeger, N. ; Streli, C. ; Wobrauschek, P. ; Jokubonis, C. ; Pepponi, G. ; Roschger, P. ; Hofstaetter, J. ; Berzlanovich, A. ; Wegrzynek, D. ; Chinea-Cano, E. ; Markowicz, A. ; Simon, R. ; Falkenberg, G. Determination of the elemental distribution in human joint bones by SR micro XRFArtikel Article2008
11Streli, C. ; Wobrauschek, P. ; Meirer, F. ; Pepponi, G. Synchrotron radiation induced TXRFArtikel Article2008
12Fittschen, U.E.A. ; Meirer, F. ; Streli, C. ; Wobrauschek, P. ; Thiele, J. ; Falkenberg, G. ; Pepponi, G. Characterization of atmospheric aerosols using Synchroton radiation total reflection X-ray fluorescence and Fe K-edge total reflection X-ray fluorescence-X-ray absorption near-edge structureArtikel Article 2008