DC FieldValueLanguage
dc.contributor.advisorHutter, Herbert-
dc.contributor.authorRosner, Martin-
dc.date.accessioned2020-06-30T11:03:47Z-
dc.date.issued2003-
dc.identifier.urihttps://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-10437-
dc.identifier.urihttp://hdl.handle.net/20.500.12708/12144-
dc.descriptionZsfassung in dt. Sprache. - Enth. 1 Sonderabdr.-
dc.formatGetr. Zählung-
dc.languageEnglish-
dc.language.isoen-
dc.subjectSekundärionen-Massenspektrometriede
dc.subjectWerkstoffkundede
dc.titleApplication of secondary ion mass spectrometry (SIMS) in the development of new materialsen
dc.typeThesisen
dc.typeHochschulschriftde
tuw.publication.orgunitE164 - Institut für Chemische Technologien und Analytik-
dc.type.qualificationlevelDoctoral-
dc.identifier.libraryidAC04053610-
dc.identifier.urnurn:nbn:at:at-ubtuw:1-10437-
dc.thesistypeDissertationde
dc.thesistypeDissertationen
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypeThesis-
item.openairetypeHochschulschrift-
item.grantfulltextopen-
item.openaccessfulltextOpen Access-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.cerifentitytypePublications-
item.fulltextwith Fulltext-
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