<div class="csl-bib-body">
<div class="csl-entry">Yuryevna Ridzel, O., Kalbe, H., Astašauskas, V., Kuksa, P., Bellissimo, A., & Werner, W. S. M. (2022). Optical constants of organic insulators in the UV range extracted from reflection electron energy loss spectra. <i>Surface and Interface Analysis</i>, <i>54</i>(5), 487–500. https://doi.org/10.1002/sia.7055</div>
</div>
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dc.identifier.issn
0142-2421
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/136638
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dc.description.abstract
Reflection electron energy loss spectroscopy (REELS) spectra were measured for seven
insulating organic compounds (DNA, Irganox 1010, Kapton, polyethylene [PE],
poly(methyl methacrylate) [PMMA], polystyrene [PS] and polytetrafluoroethylene
[PTFE]). Optical constants and energy band gaps were extracted from the measured
REELS spectra after elimination of multiple electron scattering via a deconvolution and
fitting the normalised single scattering energy loss spectra to Drude and Drude-Lindhard
model dielectric functions, constrained by the Kramers-Kronig sum and f-sum rules. Satisfactory
agreement is found for those optical constants for which literature data exists.
For PTFE, the observed features in the optical data correspond to its electronic structure.
en
dc.language.iso
en
-
dc.publisher
WILEY
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dc.relation.ispartof
Surface and Interface Analysis
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dc.subject
Condensed Matter Physics
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dc.subject
General Chemistry
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dc.subject
Surfaces, Coatings and Films
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dc.subject
Materials Chemistry
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dc.subject
electron inelastic mean free path
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dc.subject
insulators
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dc.subject
optical constants
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dc.subject
organic polymers
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dc.subject
reflection electron energy loss spectroscopy
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dc.subject
Surfaces and Interfaces
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dc.title
Optical constants of organic insulators in the UV range extracted from reflection electron energy loss spectra
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
487
-
dc.description.endpage
500
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dc.type.category
Original Research Article
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tuw.container.volume
54
-
tuw.container.issue
5
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.value
100
-
dcterms.isPartOf.title
Surface and Interface Analysis
-
tuw.publication.orgunit
E134-01 - Forschungsbereich Applied and Computational Physics
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tuw.publisher.doi
10.1002/sia.7055
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dc.identifier.eissn
1096-9918
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dc.description.numberOfPages
14
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tuw.author.orcid
0000-0002-7162-238X
-
tuw.author.orcid
0000-0001-8504-2848
-
tuw.author.orcid
0000-0002-4870-9137
-
wb.sci
true
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
1030
-
wb.facultyfocus
Physik der Materie
de
wb.facultyfocus
Physics of Matter
en
wb.facultyfocus.faculty
E130
-
item.languageiso639-1
en
-
item.openairetype
research article
-
item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.dept
E387-01 - Forschungsbereich Photonik
-
crisitem.author.dept
E134-03 - Forschungsbereich Atomic and Plasma Physics