<div class="csl-bib-body">
<div class="csl-entry">Butej, B., Padovan, V., Pogany, D., Pobegen, G., Ostermaier, C., & Koller, C. (2022). Method to Distinguish Between Buffer and Surface Trapping in Stressed Normally-ON GaN GITs Using the Gate-Voltage Dependence of Recovery Time Constants. <i>IEEE Transactions on Electron Devices</i>, <i>69</i>(6), 3087–3093. https://doi.org/10.1109/ted.2022.3170293</div>
</div>
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dc.identifier.issn
0018-9383
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/136860
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dc.language.iso
en
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dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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dc.relation.ispartof
IEEE Transactions on Electron Devices
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dc.subject
Electrical and Electronic Engineering
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dc.subject
Electronic, Optical and Magnetic Materials
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dc.title
Method to Distinguish Between Buffer and Surface Trapping in Stressed Normally-ON GaN GITs Using the Gate-Voltage Dependence of Recovery Time Constants
