<div class="csl-bib-body">
<div class="csl-entry">Shah, A. P., & Waltl, M. (2021). Impact of Negative Bias Temperature Instability on Single Event Transients in Scaled Logic Circuits. <i>International Journal of Numerical Modelling: Electronic Networks, Devices and Fields</i>, <i>34</i>(3). https://doi.org/10.1002/jnm.2854</div>
</div>
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dc.identifier.issn
0894-3370
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/137298
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dc.language.iso
en
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dc.publisher
WILEY
-
dc.relation.ispartof
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
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dc.subject
Electrical and Electronic Engineering
-
dc.subject
Computer Science Applications
-
dc.subject
Modeling and Simulation
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dc.title
Impact of Negative Bias Temperature Instability on Single Event Transients in Scaled Logic Circuits
en
dc.type
Artikel
de
dc.type
Article
en
dc.type.category
Original Research Article
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tuw.container.volume
34
-
tuw.container.issue
3
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
Q4
-
tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.value
100
-
dcterms.isPartOf.title
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
