<div class="csl-bib-body">
<div class="csl-entry">Konvalina, I., Daniel, B., Zouhar, M., Paták, A., Müllerová, I., Frank, L., Piňos, J., Průcha, L., Radlička, T., Werner, W. S. M., & Mikmeková, E. M. (2021). Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer. <i>Nanomaterials</i>, <i>11</i>(9), Article 2435. https://doi.org/10.3390/nano11092435</div>
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dc.identifier.issn
2079-4991
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/137843
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dc.description.abstract
The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method.
en
dc.language.iso
en
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dc.publisher
MDPI
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dc.relation.ispartof
Nanomaterials
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dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
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dc.subject
General Materials Science
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dc.subject
graphene
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dc.subject
General Chemical Engineering
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dc.subject
time-of-flight spectrometer
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dc.subject
inelastic mean free path
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dc.subject
density-functional theory
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dc.subject
manybody perturbation theory
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dc.subject
energy-loss spectrum
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dc.subject
density of states
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dc.subject
band structure
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dc.title
Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
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dc.type
Artikel
de
dc.type
Article
en
dc.rights.license
Creative Commons Namensnennung 4.0 International
de
dc.rights.license
Creative Commons Attribution 4.0 International
en
dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic
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dc.contributor.affiliation
Institute of Scientific Instruments of the Czech Academy of Sciences, Czech Republic