<div class="csl-bib-body">
<div class="csl-entry">Wang, M., Ramer, G., Perez Morelo, D., Pavlidis, G., Schwartz, J., Yu, L., Ilic, R., Aksyuk, V. A., & Centrone, A. (2022). High Throughput Nanoimaging of Thermal Conductivity and Interfacial Thermal Conductance. <i>Nano Letters</i>, <i>22</i>(11), 4325–4332. https://doi.org/10.1021/acs.nanolett.2c00337</div>
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dc.identifier.issn
1530-6984
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/139445
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dc.description.abstract
Thermal properties of materials are often determined by measuring thermalization processes; however, such measurements at the nanoscale are challenging because they require high sensitivity concurrently with high temporal and spatial resolutions. Here, we develop an optomechanical cantilever probe and customize an atomic force microscope with low detection noise ≈1 fm/Hz1/2 over a wide (>100 MHz) bandwidth that measures thermalization dynamics with ≈10 ns temporal resolution, ≈35 nm spatial resolution, and high sensitivity. This setup enables fast nanoimaging of thermal conductivity (η) and interfacial thermal conductance (G) with measurement throughputs ≈6000× faster than conventional macroscale-resolution time-domain thermoreflectance acquiring the full sample thermalization. As a proof-of-principle demonstration, 100 × 100 pixel maps of η and G of a polymer particle are obtained in 200 s with a small relative uncertainty (<10%). This work paves the way to study fast thermal dynamics in materials and devices at the nanoscale.
en
dc.language.iso
en
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dc.publisher
AMER CHEMICAL SOC
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dc.relation.ispartof
Nano Letters
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dc.subject
AFM
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dc.subject
internal facial conductance
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dc.subject
nanophotonic sensor
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dc.subject
photothermal induced resonance
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dc.subject
thermal conductivity
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dc.title
High Throughput Nanoimaging of Thermal Conductivity and Interfacial Thermal Conductance