<div class="csl-bib-body">
<div class="csl-entry">Voglhuber-Brunnmaier, T., Beigelbeck, R., Schmid, U., Sauter, T., You, T., Ou, X., & Jakoby, B. (2022). Efficient and Accurate Modeling of the Surface Deflection of Thin Layers on Composite Substrates with Applications to Piezoelectric Parameter Measurements. <i>Micro</i>, <i>2</i>(3), 369–389. https://doi.org/10.3390/micro2030025</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/139782
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dc.description.abstract
The electrical and mechanical response of multilayered structures involving a piezoelectric layer and bull’s eye shaped electrodes is investigated. A boundary element method is employed based on spectral domain Green’s functions. With this method, the electric field distribution is determined first, and the local mechanical displacement in a second step. As will be shown, this allows us to exploit cylindrical symmetry for the electric surface charge distribution, but not for the vertical surface displacements. The effect of substrate bending due to in plane-stress, introduced by the piezoelectric constant , and the benefits of using bull’s eye electrode geometries with thick metallic backplates intended to reduce this effect are studied. A rigorous analysis and a largely simplified, but accurate approximation are compared. The application of this technique is demonstrated on a practical example for highly efficient and accurate determination of selected piezoelectric coefficients from surface topography measurements on such structures.
en
dc.language.iso
en
-
dc.publisher
MDPI
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dc.relation.ispartof
Micro
-
dc.subject
Thin films
en
dc.subject
Piezoelectric parameters
en
dc.subject
Boundary Element Method
en
dc.title
Efficient and Accurate Modeling of the Surface Deflection of Thin Layers on Composite Substrates with Applications to Piezoelectric Parameter Measurements
en
dc.type
Article
en
dc.type
Artikel
de
dc.contributor.affiliation
Danube Private University, Austria
-
dc.contributor.affiliation
Johannes Kepler University of Linz, Austria
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dc.description.startpage
369
-
dc.description.endpage
389
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dcterms.dateSubmitted
2022-06-02
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dc.type.category
Original Research Article
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tuw.container.volume
2
-
tuw.container.issue
3
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
wb.publication.intCoWork
International Co-publication
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.id
I8
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.name
Sensor Systems
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
40
-
tuw.researchTopic.value
10
-
dcterms.isPartOf.title
Micro
-
tuw.publication.orgunit
E384-01 - Forschungsbereich Software-intensive Systems
-
tuw.publication.orgunit
E366-01 - Forschungsbereich Mikro- und Nanosensorik
-
tuw.publisher.doi
10.3390/micro2030025
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dc.date.onlinefirst
2022-06-29
-
dc.identifier.eissn
2673-8023
-
dc.description.numberOfPages
21
-
tuw.author.orcid
0000-0002-4678-4862
-
tuw.author.orcid
0000-0003-1559-8394
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tuw.author.orcid
0000-0001-8978-4582
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tuw.author.orcid
0000-0002-0316-9958
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tuw.author.orcid
0000-0002-2918-7150
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.openairetype
research article
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item.fulltext
no Fulltext
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item.grantfulltext
none
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item.languageiso639-1
en
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item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
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item.cerifentitytype
Publications
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crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
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crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
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crisitem.author.dept
E384 - Institut für Computertechnik
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crisitem.author.dept
E363 - Institut für Biomedizinische Elektronik
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crisitem.author.orcid
0000-0002-4678-4862
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crisitem.author.orcid
0000-0003-1559-8394
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crisitem.author.orcid
0000-0001-8978-4582
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crisitem.author.orcid
0000-0002-0316-9958
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik