<div class="csl-bib-body">
<div class="csl-entry">Stubian, M., Bobek, J., Setvin, M., Diebold, U., & Schmid, M. (2020). Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond. <i>Review of Scientific Instruments</i>, <i>91</i>(7). https://doi.org/10.1063/5.0011097</div>
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dc.identifier.issn
0034-6748
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/140425
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dc.description.abstract
A transimpedance amplifier has been designed for scanning tunneling microscopy (STM). The amplifier features low noise (limited by the Johnson noise of the 1 GΩ feedback resistor at low input current and low frequencies), sufficient bandwidth for most STM applications (50 kHz at 35 pF input capacitance), a large dynamic range (0.1 pA-50 nA without range switching), and a low input voltage offset. The amplifier is also suited for placing its first stage into the cryostat of a low-temperature STM, minimizing the input capacitance and reducing the Johnson noise of the feedback resistor. The amplifier may also find applications for specimen current imaging and electron-beam-induced current measurements in scanning electron microscopy and as a photodiode amplifier with a large dynamic range. This paper also discusses the sources of noise including the often neglected effect of non-balanced input impedance of operational amplifiers and describes how to accurately measure and adjust the frequency response of low-current transimpedance amplifiers.
en
dc.language.iso
en
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dc.relation.ispartof
Review of Scientific Instruments
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dc.subject
Instrumentation
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dc.title
Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond