<div class="csl-bib-body">
<div class="csl-entry">Ingerle, D., Artner, W., Hradil, K., & Streli, C. (2020). Refitting an X-ray diffraction system for combined GIXRF and XRR measurements. <i>Powder Diffraction</i>, <i>35</i>(S1), S29–S33. https://doi.org/10.1017/s088571562000041x</div>
</div>
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dc.identifier.issn
0885-7156
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/140572
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dc.language.iso
en
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dc.publisher
CAMBRIDGE UNIV PRESS
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dc.relation.ispartof
Powder Diffraction
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dc.subject
Condensed Matter Physics
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dc.subject
General Materials Science
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dc.subject
Instrumentation
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dc.subject
Radiation
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dc.title
Refitting an X-ray diffraction system for combined GIXRF and XRR measurements