<div class="csl-bib-body">
<div class="csl-entry">Bhole, M., Kastner, W., & Sauter, T. (2022). A Model Based Framework for Testing Safety and Security in Operational Technology Environments. In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i> (pp. 1–4). https://doi.org/10.1109/ETFA52439.2022.9921549</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/142182
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dc.description.abstract
Today's industrial control systems consist of tightly coupled components allowing adversaries to exploit security attack surfaces from the information technology side, and, thus, also get access to automation devices residing at the operational technology level to compromise their safety functions. To identify these concerns, we propose a model-based testing approach which we consider a promising way to analyze the safety and security behavior of a system under test providing means to protect its components and to increase the quality and efficiency of the overall system. The structure of the underlying framework is divided into four parts, according to the critical factors in testing of operational technology environments. As a first step, this paper describes the ingredients of the envisioned framework. A system model allows to overview possible attack surfaces, while the foundations of testing and the recommendation of mitigation strategies will be based on process-specific safety and security standard procedures with the combination of existing vulnerability databases.
en
dc.description.sponsorship
TÜV Austria Holding AG
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dc.language.iso
en
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dc.subject
Industrial Control System
en
dc.subject
Model-Based Testing
en
dc.subject
Operational Technology
en
dc.subject
Safety and Security
en
dc.title
A Model Based Framework for Testing Safety and Security in Operational Technology Environments
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
978-1-6654-9996-5
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dc.description.startpage
1
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dc.description.endpage
4
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
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tuw.container.volume
2022-September
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tuw.peerreviewed
true
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tuw.project.title
Automated Risk Management for Industrial Control Systems
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tuw.researchTopic.id
I6a
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tuw.researchTopic.id
I2
-
tuw.researchTopic.id
I3
-
tuw.researchTopic.name
Digital Transformation in Manufacturing
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tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
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tuw.researchTopic.name
Automation and Robotics
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tuw.researchTopic.value
20
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tuw.researchTopic.value
60
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tuw.researchTopic.value
20
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tuw.publication.orgunit
E191-03 - Forschungsbereich Automation Systems
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tuw.publication.orgunit
E384-01 - Forschungsbereich Software-intensive Systems
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tuw.publisher.doi
10.1109/ETFA52439.2022.9921549
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dc.description.numberOfPages
4
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tuw.author.orcid
0000-0003-2334-4669
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tuw.event.name
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
en
tuw.event.startdate
06-09-2022
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tuw.event.enddate
09-09-2022
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Stuttgart
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tuw.event.country
DE
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tuw.event.institution
Universität Stuttgart
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tuw.event.presenter
Bhole, Mukund
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tuw.event.track
Multi Track
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wb.sciencebranch
Informatik
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
1020
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
60
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wb.sciencebranch.value
40
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item.grantfulltext
none
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.openairetype
conference paper
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item.languageiso639-1
en
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item.cerifentitytype
Publications
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item.fulltext
no Fulltext
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crisitem.author.dept
E191-03 - Forschungsbereich Automation Systems
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crisitem.author.dept
E640 - Vizerektorat Digitalisierung und Infrastruktur
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crisitem.author.dept
E384 - Institut für Computertechnik
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crisitem.author.orcid
0000-0003-2334-4669
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crisitem.author.orcid
0000-0001-5420-404X
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crisitem.author.orcid
0000-0003-1559-8394
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crisitem.author.parentorg
E191 - Institut für Computer Engineering
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crisitem.author.parentorg
E000 - Technische Universität Wien
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik