<div class="csl-bib-body">
<div class="csl-entry">Dervic, A., Steindl, B., Hofbauer, M., & Zimmermann, H. (2019). High-voltage active quenching and resetting circuit for SPADs in 0.35 μm CMOS for raising the photon detection probability. <i>Optical Engineering</i>, <i>58</i>(04), 1. https://doi.org/10.1117/1.oe.58.4.040501</div>
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dc.identifier.issn
0091-3286
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/142752
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dc.description.abstract
A fully integrated single-photon avalanche diode (SPAD) using a high-voltage quenching circuit fabricated in a 0.35-μm CMOS process is proposed. The quenching circuit features a quenching voltage of 9.9 V, which is three times the nominal supply voltage to increase the photon detection probability (PDP). To prove the quenching performance, the circuit has been integrated together with a large-area SPAD having an active diameter of 90 μm. Experimental verification shows a maximum PDP of 67.8% at 9.9 V excess bias at a wavelength of 642 nm.
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dc.language.iso
en
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dc.publisher
SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
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dc.relation.ispartof
Optical Engineering
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dc.subject
General Engineering
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dc.subject
Atomic and Molecular Physics, and Optics
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dc.subject
single-photon avalanche diode
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dc.subject
active quenching
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dc.subject
high-voltage quenching
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dc.subject
photon detection probability
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dc.subject
optoelectonic inte-grated circuits
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dc.subject
photodetectors.
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dc.title
High-voltage active quenching and resetting circuit for SPADs in 0.35 μm CMOS for raising the photon detection probability
