DC Field
Value
Language
dc.contributor.author
Fleury, Clément
-
dc.contributor.author
Simbürger, Werner
-
dc.contributor.author
Pogany, Dionyz
-
dc.date.accessioned
2023-01-30T15:19:28Z
-
dc.date.available
2023-01-30T15:19:28Z
-
dc.date.issued
2019
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Fleury, C., Simbürger, W., &#38; Pogany, D. (2019). Effect of TLP rise time on ESD failure modes of collector-base junction of SiGe heterojunction bipolar transistors. <i>Microelectronics Reliability</i>, <i>100–101</i>(113331). https://doi.org/10.1016/j.microrel.2019.06.023</div> </div>
-
dc.identifier.issn
0026-2714
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/143369
-
dc.language.iso
en
-
dc.publisher
PERGAMON-ELSEVIER SCIENCE LTD
-
dc.relation.ispartof
Microelectronics Reliability
-
dc.subject
Electrical and Electronic Engineering
-
dc.subject
Condensed Matter Physics
-
dc.subject
Electronic, Optical and Magnetic Materials
-
dc.subject
Atomic and Molecular Physics, and Optics
-
dc.subject
Safety, Risk, Reliability and Quality
-
dc.subject
Surfaces, Coatings and Films
-
dc.title
Effect of TLP rise time on ESD failure modes of collector-base junction of SiGe heterojunction bipolar transistors
en
dc.type
Artikel
de
dc.type
Article
en
dc.type.category
Original Research Article
-
tuw.container.volume
100-101
-
tuw.container.issue
113331
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
dcterms.isPartOf.title
Microelectronics Reliability
-
tuw.publication.orgunit
E362 - Institut für Festkörperelektronik
-
tuw.publisher.doi
10.1016/j.microrel.2019.06.023
-
dc.identifier.eissn
1872-941X
-
dc.description.numberOfPages
6
-
wb.sci
true
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.oefos
1030
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
-
item.grantfulltext
restricted
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
item.openairetype
research article
-
item.languageiso639-1
en
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E362 - Institut für Festkörperelektronik
-
crisitem.author.dept
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
crisitem.author.parentorg
E362 - Institut für Festkörperelektronik
-
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