<div class="csl-bib-body">
<div class="csl-entry">Notermans, G., Ritter, H.-M., Holland, S., & Pogany, D. (2019). Dynamic Voltage Overshoot During Triggering on an SCR-Type ESD Protection. <i>IEEE Transactions on Device and Materials Reliability</i>, <i>19</i>(4), 583–590. https://doi.org/10.1109/tdmr.2019.2952713</div>
</div>
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dc.identifier.issn
1530-4388
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/143703
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dc.language.iso
en
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dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
-
dc.relation.ispartof
IEEE Transactions on Device and Materials Reliability
-
dc.subject
Electrical and Electronic Engineering
en
dc.subject
Electronic, Optical and Magnetic Materials
en
dc.subject
Safety, Risk, Reliability and Quality
en
dc.title
Dynamic Voltage Overshoot During Triggering on an SCR-Type ESD Protection
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
583
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dc.description.endpage
590
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dc.type.category
Original Research Article
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tuw.container.volume
19
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tuw.container.issue
4
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tuw.journal.peerreviewed
true
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tuw.peerreviewed
true
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wb.publication.intCoWork
International Co-publication
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tuw.researchTopic.id
M1
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tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
dcterms.isPartOf.title
IEEE Transactions on Device and Materials Reliability
