<div class="csl-bib-body">
<div class="csl-entry">Puschkarsky, K., Reisinger, H., Schlünder, C., Gustin, W., & Grasser, T. (2018). Voltage-Dependent Activation Energy Maps for Analytic Lifetime Modeling of NBTI Without Time Extrapolation. <i>IEEE Transactions on Electron Devices</i>, <i>65</i>(11), 4764–4771. https://doi.org/10.1109/ted.2018.2870170</div>
</div>
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0018-9383
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http://hdl.handle.net/20.500.12708/144569
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en
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IEEE Transactions on Electron Devices
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Electrical and Electronic Engineering
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dc.subject
Electronic, Optical and Magnetic Materials
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dc.title
Voltage-Dependent Activation Energy Maps for Analytic Lifetime Modeling of NBTI Without Time Extrapolation
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Artikel
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Article
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4764
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4771
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Original Research Article
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65
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11
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Materials Characterization
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Modelling and Simulation
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IEEE Transactions on Electron Devices
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E360 - Institut für Mikroelektronik
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10.1109/ted.2018.2870170
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Elektrotechnik, Elektronik, Informationstechnik
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2020
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Mikro- und Nanoelektronik
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Micro- and Nanoelectronics
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Infineon Technologies (Germany)
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Infineon Technologies (Germany), Germany
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Infineon Technologies (Germany)
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E360 - Institut für Mikroelektronik
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E350 - Fakultät für Elektrotechnik und Informationstechnik
