<div class="csl-bib-body">
<div class="csl-entry">Haghbayan, M.-H., Rahmani, A.-M., Liljeberg, P., Jantsch, A., Miele, A., Bolchini, C., & Tenhunen, H. (2017). Can Dark Silicon Be Exploited to Prolong System Lifetime? <i>IEEE Design and Test</i>, <i>34</i>(2), 51–59. https://doi.org/10.1109/mdat.2016.2630317</div>
</div>
-
dc.identifier.issn
2168-2356
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/146276
-
dc.language.iso
en
-
dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
-
dc.relation.ispartof
IEEE Design and Test
-
dc.subject
Electrical and Electronic Engineering
-
dc.subject
Software
-
dc.subject
Hardware and Architecture
-
dc.title
Can Dark Silicon Be Exploited to Prolong System Lifetime?
-
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
51
-
dc.description.endpage
59
-
dc.type.category
Original Research Article
-
tuw.container.volume
34
-
tuw.container.issue
2
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
wb.publication.intCoWork
International Co-publication
-
tuw.researchTopic.id
I2
-
tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
