<div class="csl-bib-body">
<div class="csl-entry">Sieger, M., Pahlke, P., Ottolinger, R., Stafford, B. H., Lao, M., Meledin, A., Bauer, M., Eisterer, M., Van Tendeloo, G., Schultz, L., Nielsch, K., & Hühne, R. (2017). Influence of Substrate Tilt Angle on the Incorporation of BaHfO3 in Thick YBa2Cu3O7-δ Films. <i>IEEE Transactions on Applied Superconductivity</i>, <i>27</i>(4). https://doi.org/10.1109/tasc.2016.2631587</div>
</div>
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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IEEE Transactions on Applied Superconductivity
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dc.subject
Electrical and Electronic Engineering
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dc.subject
Condensed Matter Physics
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dc.subject
Electronic, Optical and Magnetic Materials
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dc.title
Influence of Substrate Tilt Angle on the Incorporation of BaHfO3 in Thick YBa2Cu3O7-δ Films
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Structure-Property Relationship
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IEEE Transactions on Applied Superconductivity
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E141-06 - Forschungsbereich Low Temperature Physics and Superconductivity
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