<div class="csl-bib-body">
<div class="csl-entry">Wimmer, Y., El-Sayed, A.-M., Gös, W., Grasser, T., & Shluger, A. L. (2016). Role of hydrogen in volatile behaviour of defects in SiO₂-based electronic devices. <i>Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences</i>, <i>472</i>(2190). https://doi.org/10.1098/rspa.2016.0009</div>
</div>
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ROYAL SOC
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Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences
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General Mathematics
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General Engineering
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General Physics and Astronomy
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dc.title
Role of hydrogen in volatile behaviour of defects in SiO₂-based electronic devices
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Artikel
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Article
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Original Research Article
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472
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2190
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Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences
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10.1098/rspa.2016.0009
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Mikro- und Nanoelektronik
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Micro- and Nanoelectronics
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