<div class="csl-bib-body">
<div class="csl-entry">Fleig, J., Schmid, A., Rupp, G., Slouka, C., Navickas, E., Andrejs, L., Hutter, H., Volgger, L., & Nenning, A. (2016). The Chemical Capacitance as a Fingerprint of Defect Chemistry in Mixed Conducting Oxides. <i>Acta Chimica Slovenica</i>, <i>63</i>(3), 509–518. https://doi.org/10.17344/acsi.2016.2302</div>
</div>
-
dc.identifier.issn
1318-0207
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/149010
-
dc.language.iso
en
-
dc.publisher
SLOVENSKO KEMIJSKO DRUSTVO
-
dc.relation.ispartof
Acta Chimica Slovenica
-
dc.title
The Chemical Capacitance as a Fingerprint of Defect Chemistry in Mixed Conducting Oxides
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
509
-
dc.description.endpage
518
-
dc.type.category
Original Research Article
-
tuw.container.volume
63
-
tuw.container.issue
3
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.value
100
-
dcterms.isPartOf.title
Acta Chimica Slovenica
-
tuw.publication.orgunit
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
