<div class="csl-bib-body">
<div class="csl-entry">Fürst, M. E., Berlakovich, N., Csencsics, E., & Schitter, G. (2022). Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics. In <i>Optical Manufacturing and Testing XIV</i>. SPIE Optical Engineering + Applications, United States of America (the). https://doi.org/10.1117/12.2628328</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/153900
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dc.description.abstract
The Shack-Hartmann wavefront sensor has the potential to directly characterize the optical performance of a freeform part by measuring the wavefront transmitted or reflected by the part. However, the traditional Shack-Hartmann sensor’s small dynamic range and aperture limit its applicability on strongly curved or extended freeform parts. The combination of a Shack-Hartmann sensor with a highly precise positioning system and a suitable registration algorithm can overcome these limitations. This paper presents an integrated and fully automated measurement system that is based on a scanning Shack-Hartmann sensor, demonstrates the enabled dynamic range extension, and presents measurement results obtained from a microscope objective with a numerical aperture of 0.65. The results show the capability of measuring a wavefront with an opening angle of ±80◦ and detecting an rms wavefront error of 0.28 λ.
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dc.language.iso
en
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dc.subject
mechatronics
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dc.subject
Optical metrology
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dc.subject
Shack-Hartmann sensor
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dc.subject
wavefront sensing
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dc.title
Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics