<div class="csl-bib-body">
<div class="csl-entry">Sulz, C. (2022, November 17). <i>Tactile Surface Roughness Measurement System for In Situ Measurement in Machine Tools</i> [Conference Presentation]. 3D Metrology Conference, Aachen, Austria. http://hdl.handle.net/20.500.12708/154361</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/154361
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dc.description.sponsorship
Breitmeier Messtechnik GmbH
-
dc.language.iso
en
-
dc.subject
Artificial Intelligence (AI)
en
dc.subject
Artificial Intelligence (AI)
-
dc.title
Tactile Surface Roughness Measurement System for In Situ Measurement in Machine Tools
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.relation.grantno
22013
-
dc.type.category
Conference Presentation
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tuw.publication.invited
invited
-
tuw.project.title
Integration eines Oberflächenrauheits-Messsystems für die In-situ-Messung in Werkzeugmaschinen
-
tuw.researchTopic.id
I8
-
tuw.researchTopic.name
Sensor Systems
-
tuw.researchTopic.value
100
-
tuw.publication.orgunit
E311-01-4 - Forschungsgruppe Fertigungsmesstechnik und adaptronische Systeme
-
tuw.author.orcid
0000-0002-8117-8235
-
tuw.event.name
3D Metrology Conference
-
tuw.event.startdate
15-11-2022
-
tuw.event.enddate
17-11-2022
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
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tuw.event.place
Aachen
-
tuw.event.country
AT
-
tuw.event.institution
RWTH Aachen
-
tuw.event.presenter
Sulz, Clemens
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tuw.event.track
Single Track
-
wb.sciencebranch
Maschinenbau
-
wb.sciencebranch
Werkstofftechnik
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2030
-
wb.sciencebranch.oefos
2050
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
70
-
wb.sciencebranch.value
15
-
wb.sciencebranch.value
15
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item.languageiso639-1
en
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item.openairetype
conference paper not in proceedings
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item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_18cp
-
crisitem.author.dept
E311-01-4 - Forschungsgruppe Fertigungsmesstechnik und adaptronische Systeme