<div class="csl-bib-body">
<div class="csl-entry">Holzlechner, G., Kubicek, M., Hutter, H., & Fleig, J. (2013). A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides. <i>Journal of Analytical Atomic Spectrometry</i>, <i>28</i>(7), 1648. https://doi.org/10.1039/c3ja50059d</div>
</div>
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dc.identifier.issn
0267-9477
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http://hdl.handle.net/20.500.12708/155157
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dc.language.iso
en
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dc.publisher
ROYAL SOC CHEMISTRY
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dc.relation.ispartof
Journal of Analytical Atomic Spectrometry
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dc.subject
Spectroscopy
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dc.subject
Analytical Chemistry
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dc.title
A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides
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Artikel
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Article
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dc.description.startpage
1648
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Original Research Article
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28
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7
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M2
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M8
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Materials Characterization
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Structure-Property Relationship
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50
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50
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dcterms.isPartOf.title
Journal of Analytical Atomic Spectrometry
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E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
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tuw.publication.orgunit
E164-04-3 - Forschungsgruppe Festkörperionik
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10.1039/c3ja50059d
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1364-5544
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10
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Chemie
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Chemistry and Technology of Materials
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Chemistry and Technology of Materials
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E150
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research article
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E164 - Institut für Chemische Technologien und Analytik
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E164-04-3 - Forschungsgruppe Festkörperionik
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E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
