<div class="csl-bib-body">
<div class="csl-entry">Kaiser, U., & Stöger-Pollach, M. (2014). Foreword to the special issue low-voltage electron microscopy. <i>Ultramicroscopy</i>, <i>145</i>, 1–2. https://doi.org/10.1016/j.ultramic.2014.05.002</div>
</div>
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dc.identifier.issn
0304-3991
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/156877
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dc.description.abstract
Today, low voltage electron microscopy is a topic of high relevance all over the world; in Japan [1], America [2], and Germany [3] particular research projects are even dedicated to unravel the atomic and electronic structure of radiation sensitive matter with 60 kV electrons and below. It seems that research comes back to its voltage-routes of the early days of electron microscopy, when in 1933, the German engineer and later Nobel Laureate Ernst Ruska approached the German Research Foundation for support to develop an "Übermikroskop" with a 60 kV electron beam enabling the visualization of the structure of sub-micrometer objects such as viruses which cannot be imaged with the light microscope [4]. What happened since then? The dreams of Otto Scherzer [5] and of Richard Feynman [6] to realize atomic-resolution electron microscopy has become true by the correction of the aberrations of the electron lenses [7], [8] and [9]. Today mankind benefits from a more detailed insight into the atomic and electronic structure of matter than ever before.
en
dc.language.iso
en
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dc.publisher
ELSEVIER
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dc.relation.ispartof
Ultramicroscopy
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dc.subject
Electronic, Optical and Magnetic Materials
en
dc.subject
Atomic and Molecular Physics, and Optics
en
dc.subject
Instrumentation
en
dc.title
Foreword to the special issue low-voltage electron microscopy
en
dc.type
Artikel
de
dc.type
Article
en
dc.contributor.affiliation
Universität Ulm, Germany
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dc.description.startpage
1
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dc.description.endpage
2
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dc.type.category
Editorial
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tuw.container.volume
145
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tuw.journal.peerreviewed
true
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tuw.peerreviewed
false
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wb.publication.intCoWork
International Co-publication
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tuw.researchTopic.id
M2
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tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.value
100
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dcterms.isPartOf.title
Ultramicroscopy
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tuw.publication.orgunit
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
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tuw.publisher.doi
10.1016/j.ultramic.2014.05.002
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dc.date.onlinefirst
2014-05-17
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dc.identifier.eissn
1879-2723
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dc.description.numberOfPages
2
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tuw.author.orcid
0000-0003-0582-4044
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tuw.author.orcid
0000-0002-5450-4621
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wb.sci
true
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wb.sciencebranch
Physik, Astronomie
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wb.sciencebranch
Chemie
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wb.sciencebranch.oefos
1030
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wb.sciencebranch.oefos
1040
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http://purl.org/coar/resource_type/c_b239
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none
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item.languageiso639-1
en
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item.cerifentitytype
Publications
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item.fulltext
no Fulltext
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item.openairetype
editorial
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crisitem.author.dept
Universit�t Ulm
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crisitem.author.dept
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie