<div class="csl-bib-body">
<div class="csl-entry">Langegger, R., Hradil, K., Steiger-Thirsfeld, A., Bertagnolli, E., & Lugstein, A. (2014). Peculiarities of temperature dependent ion beam sputtering and channeling of crystalline bismuth. <i>Nanotechnology</i>, <i>104</i>(16), 1–6. https://doi.org/10.1088/0957-4484/25/30/305302</div>
</div>
-
dc.identifier.issn
0957-4484
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/157648
-
dc.language.iso
en
-
dc.relation.ispartof
Nanotechnology
-
dc.subject
Physics and Astronomy (miscellaneous)
en
dc.title
Peculiarities of temperature dependent ion beam sputtering and channeling of crystalline bismuth
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
1
-
dc.description.endpage
6
-
dc.type.category
Original Research Article
-
tuw.container.volume
104
-
tuw.container.issue
16
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M7
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.name
Special and Engineering Materials
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
dcterms.isPartOf.title
Nanotechnology
-
tuw.publication.orgunit
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
tuw.publication.orgunit
E362 - Institut für Festkörperelektronik
-
tuw.publisher.doi
10.1088/0957-4484/25/30/305302
-
dc.date.onlinefirst
2014-07-10
-
dc.identifier.articleid
305302
-
dc.identifier.eissn
1361-6528
-
dc.description.numberOfPages
6
-
tuw.author.orcid
0000-0002-6989-2495
-
tuw.author.orcid
0000-0003-1641-3902
-
wb.sci
true
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
-
item.languageiso639-1
en
-
item.openairetype
research article
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
crisitem.author.dept
E362 - Institut für Festkörperelektronik
-
crisitem.author.dept
E057-04 - Fachbereich Röntgenzentrum
-
crisitem.author.dept
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
