<div class="csl-bib-body">
<div class="csl-entry">Lorenz, J., Bär, E., Clees, T., Jancke, R., Salzig, C., & Selberherr, S. (2011). Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Methodology. <i>IEEE Transactions on Electron Devices</i>, <i>58</i>(8), 2218–2226. https://doi.org/10.1109/ted.2011.2150225</div>
</div>
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0018-9383
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en
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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IEEE Transactions on Electron Devices
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dc.subject
Electrical and Electronic Engineering
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Electronic, Optical and Magnetic Materials
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dc.title
Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Methodology
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Artikel
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Article
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2218
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2226
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Original Research Article
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58
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Modelling and Simulation
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IEEE Transactions on Electron Devices
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E360 - Institut für Mikroelektronik
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10.1109/ted.2011.2150225
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Mikro- und Nanoelektronik
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Micro- and Nanoelectronics
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E350 - Fakultät für Elektrotechnik und Informationstechnik