<div class="csl-bib-body">
<div class="csl-entry">Lorenz, J., Bär, E., Clees, T., Evanschitzky, P., Jancke, R., Kampen, C., Paschen, U., Salzig, C., & Selberherr, S. (2011). Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results. <i>IEEE Transactions on Electron Devices</i>, <i>58</i>(8), 2227–2234. https://doi.org/10.1109/ted.2011.2150226</div>
</div>
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dc.identifier.issn
0018-9383
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/162144
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dc.language.iso
en
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dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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dc.relation.ispartof
IEEE Transactions on Electron Devices
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dc.subject
Electrical and Electronic Engineering
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dc.subject
Electronic, Optical and Magnetic Materials
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dc.title
Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results
