<div class="csl-bib-body">
<div class="csl-entry">Franco, J., Kaczer, B., Toledano-Luque, M., Roussel, Ph. J., Hehenberger, P. P., Grasser, T., Mitard, J., Eneman, G., Witters, L., Hoffmann, T. Y., & Groeseneken, G. (2011). On the impact of the Si passivation layer thickness on the NBTI of nanoscaled Si0.45Ge0.55 pMOSFETs. <i>Microelectronic Engineering</i>, <i>88</i>(7), 1388–1391. https://doi.org/10.1016/j.mee.2011.03.065</div>
</div>
-
dc.identifier.issn
0167-9317
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/162277
-
dc.language.iso
en
-
dc.publisher
ELSEVIER
-
dc.relation.ispartof
Microelectronic Engineering
-
dc.subject
Electrical and Electronic Engineering
-
dc.subject
Condensed Matter Physics
-
dc.subject
Electronic, Optical and Magnetic Materials
-
dc.subject
Atomic and Molecular Physics, and Optics
-
dc.subject
Surfaces, Coatings and Films
-
dc.title
On the impact of the Si passivation layer thickness on the NBTI of nanoscaled Si0.45Ge0.55 pMOSFETs
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
1388
-
dc.description.endpage
1391
-
dc.type.category
Original Research Article
-
tuw.container.volume
88
-
tuw.container.issue
7
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.name
Modelling and Simulation
-
tuw.researchTopic.value
100
-
dcterms.isPartOf.title
Microelectronic Engineering
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
tuw.publisher.doi
10.1016/j.mee.2011.03.065
-
dc.identifier.eissn
1873-5568
-
dc.description.numberOfPages
4
-
wb.sci
true
-
wb.sciencebranch
Elektrotechnik, Elektronik
-
wb.sciencebranch.oefos
25
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
-
item.languageiso639-1
en
-
item.openairetype
research article
-
item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
