<div class="csl-bib-body">
<div class="csl-entry">Bodewits, E., Hoekstra, R., Kowarik, G., Dobes, K., & Aumayr, F. (2011). Highly-charged-ion-induced electron emission from C₆₀ thin films. <i>Physical Review A</i>, <i>84</i>(042901). https://doi.org/10.1103/physreva.84.042901</div>
</div>
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dc.identifier.issn
2469-9926
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/162385
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dc.description.abstract
The secondary electron yields as a result of highly charged ions impinging on clean Au(111) and thin films of
C60 on Au have been measured. This has been done for film thicknesses of one to five monolayers and several
charge states of Ar and Xe ions. For all ions an increase of 35% in the secondary electron yield is observed when
going from Au(111) to multiple C60 layers. The increase remains constant for a wide range (7-26) of charge
states. Possible scenarios are given to explain the increase in electron yield.
en
dc.language.iso
en
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dc.publisher
AMER PHYSICAL SOC
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dc.relation.ispartof
Physical Review A
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dc.subject
Atomic and Molecular Physics, and Optics
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dc.title
Highly-charged-ion-induced electron emission from C₆₀ thin films
en
dc.type
Artikel
de
dc.type
Article
en
dc.type.category
Original Research Article
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tuw.container.volume
84
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tuw.container.issue
042901
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tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
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tuw.researchTopic.id
M2
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tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.value
100
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dcterms.isPartOf.title
Physical Review A
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tuw.publication.orgunit
E134-03 - Forschungsbereich Atomic and Plasma Physics