<div class="csl-bib-body">
<div class="csl-entry">Schweiger, K., Hofbauer, M., Dietrich, H., Zimmermann, H., Voss, K. O., & Merk, B. (2012). Position dependent measurement of single event transient voltage pulse shapes under heavy ion irradiation. <i>Electronics Letters</i>, <i>48</i>(3), 171–172. https://doi.org/10.1049/el.2011.3767</div>
</div>
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dc.identifier.issn
0013-5194
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/163434
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dc.description.abstract
A CMOS inverter in 90 nm CMOS bulk technology was exposed to heavy ion radiation (Au-197) at a micro-beam facility. The targeted inverter occupies an area of 6×3 µm². The resulting single event transient (SET) voltage pulses at the output were measured using an on-chip analogue sense amplifier. The output of the amplifier was recorded with a 15 GHz real-time oscilloscope. Depending on the location of the ion hits strongly different pulse shapes were observed.
en
dc.language.iso
en
-
dc.publisher
WILEY
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dc.relation.ispartof
Electronics Letters
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dc.subject
Electrical and Electronic Engineering
en
dc.subject
heavy ion irradiation
en
dc.subject
single event transient voltage pulse shapes
en
dc.title
Position dependent measurement of single event transient voltage pulse shapes under heavy ion irradiation
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
171
-
dc.description.endpage
172
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dc.type.category
Original Research Article
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tuw.container.volume
48
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tuw.container.issue
3
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
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wb.publication.intCoWork
International Co-publication
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tuw.researchTopic.id
C7
-
tuw.researchTopic.id
Q4
-
tuw.researchTopic.id
I2
-
tuw.researchTopic.name
Risk based Design
-
tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
-
tuw.researchTopic.value
30
-
tuw.researchTopic.value
30
-
tuw.researchTopic.value
40
-
dcterms.isPartOf.title
Electronics Letters
-
tuw.publication.orgunit
E354-02 - Forschungsbereich Integrated Circuits
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tuw.publisher.doi
10.1049/el.2011.3767
-
dc.identifier.eissn
1350-911X
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dc.description.numberOfPages
2
-
wb.sci
true
-
wb.sciencebranch
Elektrotechnik, Elektronik
-
wb.sciencebranch.oefos
25
-
wb.facultyfocus
Telekommunikation
de
wb.facultyfocus
Telecommunications
en
wb.facultyfocus.faculty
E350
-
item.languageiso639-1
en
-
item.openairetype
research article
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item.grantfulltext
none
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item.fulltext
no Fulltext
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item.cerifentitytype
Publications
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item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
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crisitem.author.dept
E354 - Electrodynamics, Microwave and Circuit Engineering
