<div class="csl-bib-body">
<div class="csl-entry">Haiden, C., Wopelka, T., Jech, M., Puchberger-Enengl, D., Weber, E., Keplinger, F., & Vellekoop, M. J. (2012). A microfluidic system for visualisation of individual sub-micron particles by light scattering. In R. Walczak & J. A. Dziuban (Eds.), <i>26th European Conference on Solid-State Transducers, EUROSENSOR 2012</i> (pp. 680–683). Elsevier BV. https://doi.org/10.1016/j.proeng.2012.09.238</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/164360
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dc.description.abstract
We present a novel microfluidic optical chip and corresponding sensor setup for continuous particle detection using light scattering. With the proposed device it is possible to visualise sub-micron and nanometre sized particles in liquid in order to quantify their number without the need for fluorescent labelling. The chip contains a microchannel structured in dry film resist which is crossed by a laser beam so that particles in the flow cross the beam and scatter a portion of the incident light which is recorded at 90° angle. Scattering sub-micron particles appear as clearly visible bright spots of several micrometres in diameter on the video and can individually be counted.
en
dc.language.iso
en
-
dc.relation.ispartofseries
Procedia Engineering
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dc.subject
Industrial and Manufacturing Engineering
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dc.subject
Submicron particle detection
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dc.subject
Light scattering
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dc.subject
Dry film resist
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dc.subject
Flow through microfluidic chip
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dc.title
A microfluidic system for visualisation of individual sub-micron particles by light scattering
en
dc.type
Konferenzbeitrag
de
dc.type
Inproceedings
en
dc.relation.publication
26th European Conference on Solid-State Transducers, EUROSENSOR 2012
-
dc.contributor.affiliation
TU Wien, Österreich
-
dc.contributor.affiliation
TU Wien, Österreich
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dc.relation.issn
1877-7058
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dc.description.startpage
680
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dc.description.endpage
683
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
26th European Conference on Solid-State Transducers, EUROSENSOR 2012
-
tuw.relation.publisher
Elsevier BV
-
tuw.researchTopic.id
I8
-
tuw.researchTopic.id
M7
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Sensor Systems
-
tuw.researchTopic.name
Special and Engineering Materials
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tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.value
45
-
tuw.researchTopic.value
35
-
tuw.researchTopic.value
20
-
tuw.publication.orgunit
E366-01 - Forschungsbereich Mikro- und Nanosensorik
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tuw.publisher.doi
10.1016/j.proeng.2012.09.238
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dc.description.numberOfPages
4
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tuw.editor.orcid
0000-0003-4111-8593
-
tuw.event.name
Proc. Eurosensors XXVI
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wb.sci
false
-
tuw.event.startdate
09-09-2012
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tuw.event.enddate
12-09-2012
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Krakau
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tuw.event.country
PL
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tuw.event.presenter
Haiden, Christoph
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wb.sciencebranch
Elektrotechnik, Elektronik
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wb.sciencebranch
Sonstige und interdisziplinäre Technische Wissenschaften
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wb.sciencebranch.oefos
25
-
wb.sciencebranch.oefos
29
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
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item.grantfulltext
none
-
item.languageiso639-1
en
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item.openairetype
conference paper
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item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.dept
E366-01 - Forschungsbereich Mikro- und Nanosensorik
-
crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
crisitem.author.parentorg
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
