<div class="csl-bib-body">
<div class="csl-entry">Reisinger, H., Vollertsen, R. P., Wagner, P.-J., Huttner, T., Martin, A., Aresu, S., Gustin, W., Grasser, T., & Schlünder, C. (2009). A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided Oxides. <i>IEEE Transactions on Device and Materials Reliability</i>, <i>9</i>(2), 106–114. https://doi.org/10.1109/tdmr.2009.2021389</div>
</div>
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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IEEE Transactions on Device and Materials Reliability
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Electrical and Electronic Engineering
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Electronic, Optical and Magnetic Materials
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Safety, Risk, Reliability and Quality
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A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided Oxides
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114
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