<div class="csl-bib-body">
<div class="csl-entry">Meirer, F., Singh, A., Pepponi, G., Streli, C., Homma, T., & Pianetta, P. (2010). Synchrotron radiation-induced total reflection X-ray fluorescence analysis. <i>Trends in Analytical Chemistry</i>, <i>29</i>(6), 479–496. https://doi.org/10.1016/j.trac.2010.04.001</div>
</div>
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dc.identifier.issn
0165-9936
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/167131
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dc.description.abstract
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF)
analysis is a high sensitive analytical technique that offers limits of detection
in the femtogram range for most elements. Besides the analytical aspect,
SR-TXRF is mainly used in combination with angle-dependent measurements
and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain
additional information about the investigated sample. In this article, we
briefly discuss the fundamentals of SR-TXRF and follow with several examples
of recent research applying the above-mentioned combination of techniques
to analytical problems arising from industrial applications and
environmental research.
en
dc.language.iso
en
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dc.publisher
ELSEVIER SCI LTD
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dc.relation.ispartof
Trends in Analytical Chemistry
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dc.subject
Spectroscopy
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dc.subject
Analytical Chemistry
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dc.subject
Synchrotron radiation
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dc.subject
TXRF
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dc.subject
Angle-dependent measurement
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dc.subject
GI-XRF
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dc.subject
Glancing incident
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dc.subject
SR-TXRF
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dc.subject
Total reflection X-ray fluorescence analysis
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dc.subject
TXRF-XANES
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dc.subject
X-ray absorption near-edge structure spectroscopy
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dc.title
Synchrotron radiation-induced total reflection X-ray fluorescence analysis
