<div class="csl-bib-body">
<div class="csl-entry">Dohn, S., Schmid, S., Amiot, F., & Boisen, A. (2010). Position and mass determination of multiple particles using cantilever based mass sensors. <i>Applied Physics Letters</i>, <i>97</i>(4), 044103. https://doi.org/10.1063/1.3473761</div>
</div>
-
dc.identifier.issn
0003-6951
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/168358
-
dc.language.iso
en
-
dc.publisher
AIP PUBLISHING
-
dc.relation.ispartof
Applied Physics Letters
-
dc.subject
Physics and Astronomy (miscellaneous)
-
dc.title
Position and mass determination of multiple particles using cantilever based mass sensors
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
044103
-
dc.type.category
Original Research Article
-
tuw.container.volume
97
-
tuw.container.issue
4
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M7
-
tuw.researchTopic.id
M8
-
tuw.researchTopic.id
I8
-
tuw.researchTopic.name
Special and Engineering Materials
-
tuw.researchTopic.name
Structure-Property Relationship
-
tuw.researchTopic.name
Sensor Systems
-
tuw.researchTopic.value
25
-
tuw.researchTopic.value
25
-
tuw.researchTopic.value
50
-
dcterms.isPartOf.title
Applied Physics Letters
-
tuw.publisher.doi
10.1063/1.3473761
-
dc.identifier.eissn
1077-3118
-
dc.description.numberOfPages
1
-
tuw.author.orcid
0000-0002-2819-7656
-
wb.sci
true
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
-
item.languageiso639-1
en
-
item.openairetype
research article
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
crisitem.author.dept
E366-01 - Forschungsbereich Mikro- und Nanosensorik
