DC Field
Value
Language
dc.contributor.author
Palestri, P
-
dc.contributor.author
Barin, N
-
dc.contributor.author
Brunel, D
-
dc.contributor.author
Busseret, C
-
dc.contributor.author
Campera, A
-
dc.contributor.author
Childs, P
-
dc.contributor.author
Driussi, F
-
dc.contributor.author
Fiegna, C.
-
dc.contributor.author
Fiori, G
-
dc.contributor.author
Gusmeroli, R
-
dc.contributor.author
Iannaccone, G
-
dc.contributor.author
Karner, Markus
-
dc.contributor.author
Kosina, Hans
-
dc.contributor.author
Lacaita, Andrea Leonardo
-
dc.contributor.author
Langer, Erasmus
-
dc.contributor.author
Majkusiak, Bogdan
-
dc.contributor.author
Monzio Compagnoni, C
-
dc.contributor.author
Poncet, A
-
dc.contributor.author
Sangiorgi, E.
-
dc.contributor.author
Selmi, L
-
dc.contributor.author
Spinelli, A
-
dc.contributor.author
Walczak, J
-
dc.date.accessioned
2023-03-10T08:56:31Z
-
dc.date.available
2023-03-10T08:56:31Z
-
dc.date.issued
2007-01
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Palestri, P., Barin, N., Brunel, D., Busseret, C., Campera, A., Childs, P., Driussi, F., Fiegna, C., Fiori, G., Gusmeroli, R., Iannaccone, G., Karner, M., Kosina, H., Lacaita, A. L., Langer, E., Majkusiak, B., Monzio Compagnoni, C., Poncet, A., Sangiorgi, E., … Walczak, J. (2007). Comparison of Modeling Approaches for the Capacitance-Voltage and Current-Voltage Characteristics of Advanced Gate Stacks. <i>IEEE Transactions on Electron Devices</i>, <i>54</i>(1), 106–114. https://doi.org/10.1109/ted.2006.887226</div> </div>
-
dc.identifier.issn
0018-9383
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/168423
-
dc.language.iso
en
-
dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
-
dc.relation.ispartof
IEEE Transactions on Electron Devices
-
dc.subject
Electrical and Electronic Engineering
-
dc.subject
Electronic, Optical and Magnetic Materials
-
dc.title
Comparison of Modeling Approaches for the Capacitance-Voltage and Current-Voltage Characteristics of Advanced Gate Stacks
en
dc.type
Artikel
de
dc.type
Article
en
dc.contributor.affiliation
Warsaw University of Technology, Poland
-
dc.description.startpage
106
-
dc.description.endpage
114
-
dc.type.category
Original Research Article
-
tuw.container.volume
54
-
tuw.container.issue
1
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tuw.journal.peerreviewed
true
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tuw.peerreviewed
true
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wb.publication.intCoWork
International Co-publication
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tuw.researchTopic.id
M1
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tuw.researchTopic.id
Q4
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tuw.researchTopic.id
C6
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tuw.researchTopic.id
C1
-
tuw.researchTopic.name
Surfaces and Interfaces
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tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.name
Modelling and Simulation
-
tuw.researchTopic.name
Computational Materials Science
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tuw.researchTopic.value
10
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tuw.researchTopic.value
30
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tuw.researchTopic.value
40
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tuw.researchTopic.value
20
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dcterms.isPartOf.title
IEEE Transactions on Electron Devices
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tuw.publication.orgunit
E360 - Institut für Mikroelektronik
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tuw.publisher.doi
10.1109/ted.2006.887226
-
dc.identifier.eissn
1557-9646
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dc.description.numberOfPages
9
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tuw.author.orcid
0000-0003-0315-514X
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tuw.author.orcid
0000-0002-8831-800X
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wb.sci
true
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wb.sciencebranch
Elektrotechnik, Elektronik
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wb.sciencebranch.oefos
25
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item.grantfulltext
restricted
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item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
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item.openairetype
research article
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item.languageiso639-1
en
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item.cerifentitytype
Publications
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item.fulltext
no Fulltext
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crisitem.author.dept
E360 - Institut für Mikroelektronik
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.dept
E360 - Institut für Mikroelektronik
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crisitem.author.dept
Warsaw University of Technology
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crisitem.author.orcid
0000-0003-0315-514X
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crisitem.author.orcid
0000-0002-8831-800X
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
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crisitem.author.parentorg
E360 - Institut für Mikroelektronik
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
-
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