<div class="csl-bib-body">
<div class="csl-entry">De Souza, R. A., Fleig, J., Maier, J., Zhang, Z., Sigle, W., & Rühle, M. (2005). Electrical resistance of low-angle tilt grain boundaries in acceptor-doped SrTiO₃ as a function of misorientation angle. <i>Journal of Applied Physics</i>, <i>97</i>(5), 053502. https://doi.org/10.1063/1.1853495</div>
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dc.identifier.issn
0021-8979
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/172964
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dc.description.abstract
The transport of charge across symmetrical low-angle [001] tilt grain boundaries in Fe-doped SrTiO3 was examined. Grain boundary resistances were obtained from impedance spectroscopy measurements on bicrystals with misorientation angles θ = 2.3°, 5.4°, and 7.8° as a function of temperature and oxygen partial pressure. By comparing these data with values predicted from a double Schottky-barrier model, we show that the resistance of a low-angle tilt grain boundary in acceptor-doped SrTiO3 is correlated with its dislocation content, but in a nontrivial manner.
en
dc.language.iso
en
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dc.publisher
AMER INST PHYSICS
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dc.relation.ispartof
Journal of Applied Physics
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dc.subject
General Physics and Astronomy
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dc.title
Electrical resistance of low-angle tilt grain boundaries in acceptor-doped SrTiO₃ as a function of misorientation angle
