DC Field
Value
Language
dc.contributor.author
Banhart, John
-
dc.contributor.author
Ebert, H.
-
dc.contributor.author
Vernes, Andras
-
dc.date.accessioned
2023-03-14T09:36:12Z
-
dc.date.available
2023-03-14T09:36:12Z
-
dc.date.issued
1997
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Banhart, J., Ebert, H., &#38; Vernes, A. (1997). Applicability of the two-current model for systems with strongly spin-dependent disorder Phys. Rev. B 56, 10 165 (1997). <i>Physical Review B</i>, <i>56</i>(16), 10165–10171. https://doi.org/10.1103/physrevb.56.10165</div> </div>
-
dc.identifier.issn
2469-9950
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/175563
-
dc.language.iso
en
-
dc.publisher
AMER PHYSICAL SOC
-
dc.relation.ispartof
Physical Review B
-
dc.title
Applicability of the two-current model for systems with strongly spin-dependent disorder Phys. Rev. B 56, 10 165 (1997).
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
10165
-
dc.description.endpage
10171
-
dc.type.category
Original Research Article
-
tuw.container.volume
56
-
tuw.container.issue
16
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
C1
-
tuw.researchTopic.name
Computational Materials Science
-
tuw.researchTopic.value
100
-
dcterms.isPartOf.title
Physical Review B
-
tuw.publication.orgunit
E134-01 - Forschungsbereich Applied and Computational Physics
-
tuw.publisher.doi
10.1103/physrevb.56.10165
-
dc.identifier.eissn
2469-9969
-
dc.description.numberOfPages
7
-
wb.sci
true
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
1030
-
wb.facultyfocus
Physik der Materie
de
wb.facultyfocus
Physics of Matter
en
wb.facultyfocus.faculty
E130
-
item.grantfulltext
none
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
item.openairetype
research article
-
item.languageiso639-1
en
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.parentorg
E130 - Fakultät für Physik
-
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