<div class="csl-bib-body">
<div class="csl-entry">Kolber, T. (2000). <i>Analysis of superhard layers with secondary ion mass spectroscopy (SIMS)</i> [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/180993</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/180993
-
dc.description
Zsfassung in dt. Sprache
-
dc.language
English
-
dc.language.iso
en
-
dc.title
Analysis of superhard layers with secondary ion mass spectroscopy (SIMS)
en
dc.type
Thesis
en
dc.type
Hochschulschrift
de
dc.contributor.affiliation
TU Wien, Österreich
-
tuw.thesisinformation
Technische Universität Wien
-
dc.type.qualificationlevel
Doctoral
-
dc.identifier.libraryid
AC03025234
-
dc.description.numberOfPages
150
-
dc.thesistype
Dissertation
de
dc.thesistype
Dissertation
en
item.languageiso639-1
en
-
item.openairetype
doctoral thesis
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_db06
-
crisitem.author.dept
E164 - Institut für Chemische Technologien und Analytik
