<div class="csl-bib-body">
<div class="csl-entry">Gritsch, M. (2000). <i>Application of secondary ion mass spectrometry for the characterisation of commercial high performance materials</i> [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/182382</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/182382
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dc.description
Zsfassung in dt. Sprache
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dc.format
Getr. Zählung
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dc.language
English
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dc.language.iso
en
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dc.subject
Hochleistungswerkstoff
de
dc.subject
Sekundärionen-Massenspektrometrie
de
dc.title
Application of secondary ion mass spectrometry for the characterisation of commercial high performance materials
