DC Field
Value
Language
dc.contributor.author
Breymesser, Alexander
-
dc.date.accessioned
2023-06-19T08:29:39Z
-
dc.date.issued
2000
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Breymesser, A. (2000). <i>Application of scanning Kelvin probe microscopy for the electrical characterization of microcrystalline silicon structures for photovoltaics</i> [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/183924</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/183924
-
dc.description
Zsfassung in dt. Sprache
-
dc.language
English
-
dc.language.iso
en
-
dc.title
Application of scanning Kelvin probe microscopy for the electrical characterization of microcrystalline silicon structures for photovoltaics
en
dc.type
Thesis
en
dc.type
Hochschulschrift
de
dc.contributor.affiliation
TU Wien, Österreich
-
tuw.thesisinformation
Technische Universität Wien
-
dc.type.qualificationlevel
Doctoral
-
dc.identifier.libraryid
AC03025527
-
dc.description.numberOfPages
135
-
dc.thesistype
Dissertation
de
dc.thesistype
Dissertation
en
item.languageiso639-1
en
-
item.openairetype
doctoral thesis
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_db06
-
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