<div class="csl-bib-body">
<div class="csl-entry">Wieland, D., Ofner, S., Stabentheiner, M., Butej, B., Koller, C., Sun, J., Minetto, A., Reiser, K., Häberlen, O., Nelhiebel, M., Glavanovics, M., Pogany, D., & Ostermaier, C. (2023). A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. In <i>2023 IEEE International Reliability Physics Symposium (IRPS)</i> (pp. 1–6). https://doi.org/10.1109/IRPS48203.2023.10117943</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/187447
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dc.language.iso
en
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dc.subject
GaN
en
dc.subject
HEMTs
en
dc.subject
short-circuit
en
dc.title
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Infineon Technologies AG, Villach, Austria
-
dc.contributor.affiliation
KAI GmbH, Villach, Austria
-
dc.contributor.affiliation
KAI GmbH, Villach, Austria
-
dc.contributor.affiliation
KAI GmbH, Villach/Austria
-
dc.contributor.affiliation
Infineon Technologies Americas Corp, El Segundo, USA
-
dc.contributor.affiliation
Infineon Technologies AG, Villach, Austria
-
dc.contributor.affiliation
Infineon Technologies AG, Am Campeon 1–15, 85579 Neubiberg, Germany
-
dc.contributor.affiliation
Infineon Technologies AG, Villach, Austria
-
dc.contributor.affiliation
KAI GmbH, Villach, Austria
-
dc.contributor.affiliation
KAI GmbH, Villach, Austria
-
dc.contributor.affiliation
Infineon Technologies AG, Villach, Austria
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dc.description.startpage
1
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dc.description.endpage
6
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2023 IEEE International Reliability Physics Symposium (IRPS)
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tuw.peerreviewed
true
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tuw.researchTopic.id
E3
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tuw.researchTopic.name
Climate Neutral, Renewable and Conventional Energy Supply Systems