<div class="csl-bib-body">
<div class="csl-entry">Ceric, H., Lacerda de Orio, R., & Selberherr, S. (2023). Statistical Study of Electromigration in Gold Interconnects. <i>Microelectronics Reliability</i>, <i>147</i>, 1–7. https://doi.org/10.1016/j.microrel.2023.115061</div>
</div>
-
dc.identifier.issn
0026-2714
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/188156
-
dc.language.iso
en
-
dc.publisher
PERGAMON-ELSEVIER SCIENCE LTD
-
dc.relation.ispartof
Microelectronics Reliability
-
dc.subject
electromigration
en
dc.subject
gold interconnects
en
dc.subject
microstructure
en
dc.subject
failure statistics
en
dc.title
Statistical Study of Electromigration in Gold Interconnects
en
dc.type
Article
en
dc.type
Artikel
de
dc.description.startpage
1
-
dc.description.endpage
7
-
dcterms.dateSubmitted
2023-02-10
-
dc.type.category
Original Research Article
-
tuw.container.volume
147
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.publication.invited
invited
-
tuw.researchTopic.id
M3
-
tuw.researchTopic.id
Q4
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.name
Metallic Materials
-
tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.value
25
-
tuw.researchTopic.value
25
-
tuw.researchTopic.value
50
-
dcterms.isPartOf.title
Microelectronics Reliability
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
-
tuw.publisher.doi
10.1016/j.microrel.2023.115061
-
dc.date.onlinefirst
2023-06-23
-
dc.identifier.articleid
115061
-
dc.identifier.eissn
1872-941X
-
dc.description.numberOfPages
7
-
tuw.author.orcid
0000-0002-5583-6177
-
wb.sci
true
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.languageiso639-1
en
-
item.openairetype
research article
-
item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.orcid
0000-0002-5583-6177
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
