<div class="csl-bib-body">
<div class="csl-entry">Kregsamer, P., Fenninger, L. J., Wobrauschek, P., & Streli, C. (2023, September 6). <i>A comprehensive uncertainty budget asessment for a TXRF spectrometer Atomika 8030C</i> [Poster Presentation]. 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods, Clausthal, Germany. http://hdl.handle.net/20.500.12708/188591</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/188591
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dc.description.abstract
Total reflection X-ray fluorescence spectrometry (TXRF) is a trace element sensitive technique down to the tow ng/g level, mainly in the context of liquid samples. The standard method for quantification is to add an internal standard element (not present in the sample of interest, also avoiding potential line overlaps) to the sample with known concentration. The manufacturers of commercially available TXRF spectrometers will usually give sensitivities for the elements starting from sodium upwards (in respect to the periodic table of elements) as fixed constants. As consequence, predefined relative sensitivities, in respect to the selected internal standard element, are used in the quantification procedure.
For one part of the so-called validation, suited certified reference materials (CRM) are used in order to compare the obtained results with the certified values. In the ideal case, for all found and quantified elements for such a CRM, the uncertainty ranges, accompanying the respective results, will embed the certified values. Many instances the user will make the observation that this will not hold true - certain elements' results will deviate from this expectation, when using the sometimes only partially covered total uncertainty budget.
A comprehensive study of the various contributions to the element specific total uncertainty budget for the named spectrometer (Atomika 8030C) will be presented and main contributors to it can be identified.
en
dc.language.iso
en
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dc.subject
X-ray fluorescence spectrometry (TXRF)
en
dc.title
A comprehensive uncertainty budget asessment for a TXRF spectrometer Atomika 8030C
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.type.category
Poster Presentation
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tuw.researchTopic.id
M2
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tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E141-05 - Forschungsbereich Radiation Physics
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tuw.author.orcid
0000-0002-3699-3003
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tuw.author.orcid
0000-0002-5141-3177
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tuw.event.name
19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods