<div class="csl-bib-body">
<div class="csl-entry">Fellinger, M., Pitthan, E., Cupak, C., Aumayr, F., & Primetzhofer, D. (2023, October 12). <i>Effects of MeV ion beams on the performance of a high sensitivity quartz crystal microbalance</i> [Presentation]. 26th International Conference on Ion Beam Analysis (IBA-2023) 18th International Conference on Particle Induced X-ray Emission (PIXE 2023), Toyama, Japan. http://hdl.handle.net/20.500.12708/189300</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/189300
-
dc.language.iso
en
-
dc.subject
quartz crystal microbalance
en
dc.subject
ion beam analysis
en
dc.subject
correlation effects
en
dc.title
Effects of MeV ion beams on the performance of a high sensitivity quartz crystal microbalance
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
Uppsala University, Sweden
-
dc.contributor.affiliation
Uppsala University, Sweden
-
dc.type.category
Presentation
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.value
100
-
tuw.linking
https://ion-beam.jp/IBAPIXE2023/
-
tuw.publication.orgunit
E134-03 - Forschungsbereich Atomic and Plasma Physics
-
tuw.author.orcid
0000-0002-1481-6604
-
tuw.author.orcid
0000-0002-9788-0934
-
tuw.event.name
26th International Conference on Ion Beam Analysis (IBA-2023) 18th International Conference on Particle Induced X-ray Emission (PIXE 2023)
en
tuw.event.startdate
07-10-2023
-
tuw.event.enddate
13-10-2023
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Toyama
-
tuw.event.country
JP
-
tuw.event.presenter
Fellinger, Martina
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.value
100
-
item.fulltext
no Fulltext
-
item.languageiso639-1
en
-
item.openairecristype
http://purl.org/coar/resource_type/R60J-J5BD
-
item.cerifentitytype
Publications
-
item.grantfulltext
none
-
item.openairetype
conference presentation
-
crisitem.author.dept
E134-03 - Forschungsbereich Atomic and Plasma Physics