<div class="csl-bib-body">
<div class="csl-entry">Selberherr, S., & Sverdlov, V. (2023). Technology Computer-Aided Design: A Key Component of Microelectronics’ Development. In A. Nathan, S. K. Saha, & R. M. Todi (Eds.), <i>75th Anniversary of the Transistor</i> (pp. 337–347). Wiley. https://doi.org/10.1002/9781394202478.ch28</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/189412
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dc.description.abstract
Technology Computer-Aided Design (TCAD) is an important enabler of microelectronics' development. We briefly review the evolution of key TCAD transport descriptions beginning with the classical drift-diffusion transport model. As complementary metal-oxide-semiconductor (CMOS) downscaling continued, more involved transport models based on higher moments of the distribution function had to be introduced. Developing comprehensive mobility models allowed extending the applicability of classical transport models for devices in the deep submicron regime. However, even more rigorous models based on quantum mechanical transport combined with atomistic ab-initio electronic calculations are required for the proper transport description of devices with nanometer dimensions. Based on a particular example of MINIMOS, we show the evolution of the transport models employed by TCAD with device downscaling.
en
dc.description.sponsorship
Christian Doppler Forschungsgesells
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dc.language.iso
en
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dc.subject
TCAD
en
dc.subject
transistor modeling
en
dc.subject
transport models
en
dc.subject
drift-diffusion transport
en
dc.subject
higher moments models
en
dc.subject
beyond CMOS modeling
en
dc.subject
TCAD for spin-based devices
en
dc.title
Technology Computer-Aided Design: A Key Component of Microelectronics' Development
en
dc.type
Book Contribution
en
dc.type
Buchbeitrag
de
dc.relation.isbn
978-1-394-20244-7
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dc.description.startpage
337
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dc.description.endpage
347
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dc.relation.grantno
P300686
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dc.type.category
Edited Volume Contribution
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tuw.booktitle
75th Anniversary of the Transistor
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tuw.peerreviewed
true
-
tuw.relation.publisher
Wiley
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tuw.relation.publisherplace
Hoboken, New Jersey
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tuw.book.chapter
28
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tuw.project.title
CD-Labor für Nichtflüchtige magnetisch-resistive Speicher und Logik
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tuw.researchTopic.id
C6
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tuw.researchTopic.name
Modeling and Simulation
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
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tuw.publisher.doi
10.1002/9781394202478.ch28
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dc.description.numberOfPages
11
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tuw.author.orcid
0000-0002-5583-6177
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.languageiso639-1
en
-
item.openairetype
book part
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item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
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item.openairecristype
http://purl.org/coar/resource_type/c_3248
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.orcid
0000-0002-5583-6177
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik